May-June 2019, Vol. 2, Issue 5-6, p. 43-47.​​

Fault Diagnosis using Genetic Algorithm
S. Chandradurga*, B. Gopi
Department of Electronics and Communication Engineering, Arasu engineering college, Kumbakonam - 612 501. India.
*Corresponding author’s e-mail:
chandradurgaswaminathan@gmail.com

Abstract

VLSI testing is used to improve the reliability of the product. The diagnosis is used to identify the fault in the circuit. In this technique used fault table and genetic algorithm for the diagnosis of the circuit. That extends the speed of testing and fault coverage in the circuit. The benchmark circuits are used for the experiment. Reduce the number of test vector required to diagnose the fault. And increase the fault coverage.

Keywords: Diagnosis; Fault table; Testing; Genetic algorithm; Test vector.

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